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Noise in Nanoscale Semiconductor Devices 2020 edition
Noise in Nanoscale Semiconductor Devices
III-V materials, 2D materials, and multi-state defects. Describes the state-of-the-art, regarding noise in nanometer semiconductor devices;Enables readers to design more reliable semiconductor devices;Offers the most up-to-date information on point defects, based on physical microscopic models.
729 pages, 443 Illustrations, color; 107 Illustrations, black and white; VI, 729 p. 550 illus., 443
| メディア | 書籍 Hardcover Book (ハードカバー付きの本) |
| リリース済み | 2020年4月27日 |
| ISBN13 | 9783030374990 |
| 出版社 | Springer Nature Switzerland AG |
| ページ数 | 729 |
| 寸法 | 150 × 220 × 20 mm · 1,20 kg |
| 言語 | ドイツ語 |
| 編集者 | Grasser, Tibor |