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Optical Long-baseline Interferometry: Concept, Implementation, Calibration, and Applicationin Astronomy Peter A. Schuller
Optical Long-baseline Interferometry: Concept, Implementation, Calibration, and Applicationin Astronomy
Peter A. Schuller
In the quest to look ever closer at astronomicalobjects, optical long-baseline interferometry hasbecome a standard tool for astronomers. It canachieve spatial resolutions exceeding that of eventhe largest telescope. Offered at major observatorieswhere interferometric instruments provide highspatial resolution often combined with spectralinformation, optical long-baseline interferometryallows for the detailed study of astronomical objectsand processes in their environment. The author PeterA. Schuller introduces the basic concepts of opticallong-baseline interferometry and uses the example ofa particular instrument to illustrate various aspectsin the development and the operation of anastronomical interferometer. Focus is put on thecalibration of the instrument both in the laboratoryand during observations. The potential ofastronomical interferometry is highlighted by a studyin which interferometric data is used to constraincomputer models of astronomical objects. This book isaimed at readers with some background in science andengineering seeking a brief introduction to opticallong-baseline interferometry in concept,implementation and application.
| メディア | 書籍 Paperback Book (ソフトカバーで背表紙を接着した本) |
| リリース済み | 2008年9月17日 |
| ISBN13 | 9783836491709 |
| 出版社 | VDM Verlag |
| ページ数 | 120 |
| 寸法 | 150 × 220 × 10 mm · 172 g |
| 言語 | 英語 |