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ISTFA 2017 Proceedings from the 43rd International Symposium for Testing and Failure Analysis ASM International
ISTFA 2017 Proceedings from the 43rd International Symposium for Testing and Failure Analysis
ASM International
The theme for the November 2017 conference is Striving for 100% Success Rate. Papers focus on the tools and techniques needed for maximizing the success rate in every aspect of the electronic device failure analysis process.
660 pages
| メディア | 書籍 Paperback Book (ソフトカバーで背表紙を接着した本) |
| リリース済み | 2018年1月30日 |
| ISBN13 | 9781627081504 |
| 出版社 | A S M International |
| ページ数 | 660 |
| 寸法 | 150 × 220 × 10 mm · 987 g (重量（概算）) |
