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Emerging Nanotechnologies: Test, Defect Tolerance, and Reliability - Frontiers in Electronic Testing Mohammad Tehranipoor 2008 edition
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Emerging Nanotechnologies: Test, Defect Tolerance, and Reliability - Frontiers in Electronic Testing
Mohammad Tehranipoor
Emerging Nanotechnologies: Test, Defect Tolerance and Reliability covers various technologies that have been developing over the last decades such as chemically assembled electronic nanotechnology, Quantum-dot Cellular Automata (QCA), and nanowires and carbon nanotubes.
424 pages, 1, black & white illustrations
| メディア | 書籍 Hardcover Book (ハードカバー付きの本) |
| リリース済み | 2007年12月10日 |
| ISBN13 | 9780387747460 |
| 出版社 | Springer-Verlag New York Inc. |
| ページ数 | 408 |
| 寸法 | 155 × 235 × 23 mm · 811 g |
| 言語 | 英語 |
| 編集者 | Tehranipoor, Mohammad |
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