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Advances in Imaging and Electron Physics Martin Hytch
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Advances in Imaging and Electron Physics
Martin Hytch
Advances in Imaging and Electron Physics, Volume 218 merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains. Specific chapters in this release cover Phase retrieval methods applied to coherent imaging, X-ray phase-contrast imaging: a broad overview of some fundamentals, Graphene and borophene as nanoscopic materials for electronics - with review of the physics, and more.
276 pages
| メディア | 書籍 Hardcover Book (ハードカバー付きの本) |
| リリース済み | 2021年6月15日 |
| ISBN13 | 9780323915052 |
| 出版社 | Elsevier Science & Technology |
| ページ数 | 276 |
| 寸法 | 152 × 229 × 18 mm · 544 g |
| 言語 | 英語 |
| シリーズ編集者 | Hawkes, Peter W. (Founder-President of the European Microscopy Society and Fellow, Microscopy and Optical Societies of America; member of the editorial boards of several microscopy journals and Serial Editor, Advances in Electron Optics, France) |
| シリーズ編集者 | Hytch, Martin (Senior Scientist, French National Centre for Research (CNRS), Toulouse, France) |
