John Okumuのリリース

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Cover for John Okumu · Labview Run Four Point Probe Device: Electrical Characterization of Semiconducting Thin Films Made Easy by Four Point Probe System Controlled by Labview (Paperback Book) (2012)

Labview Run Four Point Probe Dev... (2012)

Cover for John Okumu · Electron Impact Excitation of Helium Atom: a Distorted Wave Method Applied to Study the 23s and 23p Excitation of Helium Atom by Electron Impact (Paperback Book) (2010)

Electron Impact Excitation of He... (2010)