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Test Infrastructure Design: for Digital, Mixed-signal and Hierarchical Socs Krishnendu Chakrabarty
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Test Infrastructure Design: for Digital, Mixed-signal and Hierarchical Socs
Krishnendu Chakrabarty
Current-generation SOCs contain a heterogeneous mix of embedded cores, which include not only flat (non-hierarchical) digital modules, but also analog and hierarchical modules. The increase in SOC complexity has also been accompanied by the development of more versatile automatic test equipment (ATE). This book presents methods for modular test of heterogeneous SOCs, whereby test cost is reduced by combining effective test infrastructure design with efficient utilization of ATE resources. Test infrastructure design refers to the design and optimization of test wrappers and test access mechanisms, as well as test scheduling for efficient resource utilization.
| メディア | 書籍 Paperback Book (ソフトカバーで背表紙を接着した本) |
| リリース済み | 2011年2月28日 |
| ISBN13 | 9783843373593 |
| 出版社 | LAP LAMBERT Academic Publishing |
| ページ数 | 188 |
| 寸法 | 226 × 11 × 150 mm · 298 g |
| 言語 | ドイツ語 |