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Integrated Digital Thermometer in a Bicmos Technology Muhammad Fahim Aamir
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Integrated Digital Thermometer in a Bicmos Technology
Muhammad Fahim Aamir
In this work, an integrated digital thermometer was designed at transistor level in 0.18?m BiCMOS SiGe technology for a temperature range of -50 ?C to 130 ?C. The 1? accuracy achieved at 100 ?C is 1.21 ?C. The digital thermometer consists of temperature sensor, Instrumentation amplifier (pre-amplifier), Sample-and-Hold, Comparator, Successive Approximation Register (SAR) and Digital-to-Analog Converter (DAC). The ADC designed is a successive approximation register (SAR) ADC having a sampling rate of 5 kS/s at 3V. The main thrust of this work was to have a minimum error. As the major error source is the sensor, three different sensor topologies were designed, tested and evaluated for minimum error and size. Monte Carlo simulations were performed to check for the process and mismatch variations. The data from Monte Carlo simulation was then used to measure the error.
| メディア | 書籍 Paperback Book (ソフトカバーで背表紙を接着した本) |
| リリース済み | 2013年8月22日 |
| ISBN13 | 9783659433375 |
| 出版社 | LAP LAMBERT Academic Publishing |
| ページ数 | 124 |
| 寸法 | 150 × 7 × 225 mm · 203 g |
| 言語 | ドイツ語 |