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Phase-Contrast and Dark-Field Imaging Simon Zabler
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発送予定日 年10月8日 - 年10月26日
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Phase-Contrast and Dark-Field Imaging
Simon Zabler
The intent of this Special Issue is to provide a framework with which scientists in several different disciplines, related to phase-contrast and dark-field imaging, can illustrate their ideas and results. The articles are reviews or very recent scientific reports; they address newcomers in the field, as well as experts and professors in fields of X-ray physics, electron, and phase-contrast X-ray imaging.
