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Advanced Scanning Electron Microscopy and X-Ray Microanalysis Patrick Echlin Softcover reprint of the original 1st ed. 1986 edition
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発送予定日 年6月4日 - 年6月16日
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Advanced Scanning Electron Microscopy and X-Ray Microanalysis
Patrick Echlin
This book has its origins in the intensive short courses on scanning elec tron microscopy and x-ray microanalysis which have been taught annually at Lehigh University since 1972.
466 pages, 357 black & white illustrations, 7 colour illustrations, biography
| メディア | 書籍 Paperback Book (ソフトカバーで背表紙を接着した本) |
| リリース済み | 2013年6月8日 |
| ISBN13 | 9781475790290 |
| 出版社 | Springer-Verlag New York Inc. |
| ページ数 | 454 |
| 寸法 | 152 × 229 × 24 mm · 630 g |
| 言語 | 英語 |
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