Fault Diagnosis of Analog Integrated Circuits - Frontiers in Electronic Testing - Prithviraj Kabisatpathy - 書籍 - Springer-Verlag New York Inc. - 9781441938282 - 2011年1月5日
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Fault Diagnosis of Analog Integrated Circuits - Frontiers in Electronic Testing 1st Ed. Softcover of Orig. Ed. 2005 edition

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Description for Sales People: Fault Diagnosis of Analog Integrated Circuits is a textbook for advanced undergraduate and graduate level students as well as practicing engineers. The objective of this book is to study the testing and fault diagnosis of analog and analog part of mixed signal circuits. A background in analog integrated circuit, artificial neural network is desirable but not essential. The text covers the testing and fault diagnosis of both bipolar and Metal Oxide Semiconductor (MOS) circuits. Fault model of the devices in analog domain has been introduced in the text. The test stimulus generations are also discussed in details. Experimental verification of some state of the art techniques has also been presented in the book. It also contains problems that can be used as quiz or homework. This book enables the reader to test an analog circuit that is implemented either in bipolar or MOS technology. Table of Contents: Fault and Fault Modelling.- Test Stimulus Generation.- Fault Diagnosis Methodology.- Design for Testability and Built-In Self-Test. Publisher Marketing: Enables the reader to test an analog circuit that is implemented either in bipolar or MOS technology. Examines the testing and fault diagnosis of analog and analog part of mixed signal circuits. Covers the testing and fault diagnosis of both bipolar and Metal Oxide Semiconductor (MOS) circuits and introduces . Also contains problems that can be used as quiz or homework.


196 pages, black & white illustrations

メディア 書籍     Paperback Book   (ソフトカバーで背表紙を接着した本)
リリース済み 2011年1月5日
発売日 2010
ISBN13 9781441938282
出版社 Springer-Verlag New York Inc.
ページ数 196
寸法 156 × 234 × 10 mm   ·   281 g
言語 英語  

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