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IDDQ Testing for CMOS and VLSI Rochit Rajsuman Unabridged edition
IDDQ Testing for CMOS and VLSI
Rochit Rajsuman
Provides coverage of IDDQ testing, including discussion of the correlation between physical defects and logical faults, and how IDDQ testing detects these defects. It should be useful as a reference for designers and test engineers.
200 pages, 91ill.
| メディア | 書籍 Hardcover Book (ハードカバー付きの本) |
| リリース済み | 1995 |
| 発売日 | 1994 |
| ISBN13 | 9780890067260 |
| 出版社 | Artech House Publishers |
| ページ数 | 193 |
| 寸法 | 158 × 230 × 17 mm · 399 g |
| 言語 | 英語 |