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Defects in SiO2 and Related Dielectrics: Science and Technology - NATO Science Series II Gianfranco Pacchioni Softcover reprint of the original 1st ed. 2000 edition
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Defects in SiO2 and Related Dielectrics: Science and Technology - NATO Science Series II
Gianfranco Pacchioni
Proceedings of the NATO Advanced Study Institute, Erice, Italy, April 8-20, 2000
624 pages, 87 black & white illustrations, biography
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