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Residual Stress Measurement by X-Ray Diffraction SAE International
Residual Stress Measurement by X-Ray Diffraction
SAE International
This editorial review of J784a is based upon decades of experience in the practical application of x-ray diffraction residual stress measurement methods in thousands of individual applications. J784 is a classic document. It serves as the only recognized standard for residual stress measurement available.
96 pages
| メディア | 書籍 Paperback Book (ソフトカバーで背表紙を接着した本) |
| リリース済み | 2003年2月28日 |
| ISBN13 | 9780768010695 |
| 出版社 | SAE International |
| ページ数 | 96 |
| 寸法 | 150 × 220 × 10 mm · 197 g (重量（概算）) |
