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Advances in Imaging and Electron Physics Peter Hawkes
Advances in Imaging and Electron Physics
Peter Hawkes
Features articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
280 pages
| メディア | 書籍 Hardcover Book (ハードカバー付きの本) |
| リリース済み | 2013年6月25日 |
| ISBN13 | 9780124077010 |
| 出版社 | Elsevier Science Publishing Co Inc |
| ページ数 | 280 |
| 寸法 | 151 × 229 × 22 mm · 657 g |
| シリーズ編集者 | Hawkes, Peter W. (Founder-President of the European Microscopy Society and Fellow, Microscopy and Optical Societies of America; member of the editorial boards of several microscopy journals and Serial Editor, Advances in Electron Optics, France) |
