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Advances in Imaging and Electron Physics: Aberration-corrected Electron Microscopy Peter Hawkes
Advances in Imaging and Electron Physics: Aberration-corrected Electron Microscopy
Peter Hawkes
The invention of the electron microscope made it possible to visualize a different world, far smaller than anything that could be seen with the traditional microscope. This volume focuses on the subject of correctors.
590 pages, Illustrations
| メディア | 書籍 Hardcover Book (ハードカバー付きの本) |
| リリース済み | 2008年11月1日 |
| ISBN13 | 9780123742209 |
| 出版社 | Elsevier Science Publishing Co Inc |
| ページ数 | 590 |
| 寸法 | 163 × 240 × 34 mm · 1,04 kg |
| シリーズ編集者 | Hawkes, Peter W. (Founder-President of the European Microscopy Society and Fellow, Microscopy and Optical Societies of America; member of the editorial boards of several microscopy journals and Serial Editor, Advances in Electron Optics, France) |
