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VLSI Design and Test 1st ed. 2017 edition
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発送予定日 年6月15日 - 年6月25日
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VLSI Design and Test
This book constitutes the refereed proceedings of the 21st International Symposium on VLSI Design and Test, VDAT 2017, held in Roorkee, India, in June/July 2017. The 48 full papers presented together with 27 short papers were carefully reviewed and selected from 246 submissions.
815 pages, 486 Illustrations, black and white; XXI, 815 p. 486 illus.
| メディア | 書籍 Book |
| リリース済み | 2017年12月22日 |
| ISBN13 | 9789811074691 |
| 出版社 | Springer Verlag, Singapore |
| ページ数 | 815 |
| 寸法 | 150 × 220 × 20 mm · 1,25 kg |
| 編集者 | Dasgupta, Sudeb |
| 編集者 | Kaushik, Brajesh Kumar |
| 編集者 | Singh, Virendra |
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