Electron Beam Lithography Process Optimization - Linfei Gu - 書籍 - GRIN Verlag - 9783656083160 - 2011年12月18日
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Electron Beam Lithography Process Optimization

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発送予定日 年6月8日 - 年6月18日
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Technical Report from the year 2011 in the subject Design (Industry, Graphics, Fashion), grade: -, University of Southern California, language: English, abstract: Currently, nanowires have aroused intensive attention due to their interesting electric and optical properties as well as potentially wide application (For example, nanowires can be used as a promising structure for transistor channels). For compound semiconductor nanowires, Nanoscale Selective Area MOCVD (Metalorganic Chemical Vapor Deposition), or NS?SAG, is a very attractive growth technique for the fabrication of sophisticated nanowire structure, because by using this technique, diameter and location of wires are controllable, with no incorporation of unwanted metals. It is achieved by deposition of a nano?openingarray ?patterned dielectric mask above the substrate. Since crystals cannot be formed on dielectric mask, nanowire growth only occurs at openings, with desired diameters and locations, as shown in Fig 1. Pattern of nano opening arrays is of vital importance since it governs the size, location and density of nanowires as wells as growth rate and behavior.

メディア 書籍     Paperback Book   (ソフトカバーで背表紙を接着した本)
リリース済み 2011年12月18日
ISBN13 9783656083160
出版社 GRIN Verlag
ページ数 36
寸法 138 × 2 × 213 mm   ·   45 g
言語 ドイツ語