Norbert Seifert

Radiation-induced Soft Error: A Chip-level Modeling - Foundations and Trends (R) in Electronic Design Automation Norbert Seifert

A simulation-based methodology of chip-level radiation-induced soft error rates that is fast and reasonably accurate is crucial to the reliability and success of a final product. This book summarises selected publications that are deemed relevant by the author to enable a truly chip-level radiation-induced soft error rate estimation methodology.